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This product is used for testing access to document shredders. The Jointed Accessibility Wedge Probe is a high precision probe made in exact accordance with UL and IEC standards such as UL60950 Figuren NAF2 and NAF3.
Contact: Eason Wang
Phone: +86-13751010017
Tel: +86-755-33168386
Email: info@iec-equipment.com
Add: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China