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  • Jointed Test Finger - Test Probe B of IEC61032
  • Jointed Test Finger - Test Probe B of IEC61032
Jointed Test Finger - Test Probe B of IEC61032Jointed Test Finger - Test Probe B of IEC61032

Jointed Test Finger - Test Probe B of IEC61032

  • Measurement & Analysis Instruments > Safety Instrument
  • Include ISO 17025 CNAS & ILAC Calibration Certificate
  • Item No.: LX-1202
  • Made in China
  • Product description: The Jointed Test Finger is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, I
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The Jointed Test Finger is a precision test probe made according to Figure 2 (Fig. 2) of the IEC 61032 (Test probe B) and is used to simulate a human finger. It is also used by the standards of CSA, IRAM, UL and in most of the rules involved in the verification of accessibility to live parts.

Technical Parameters:

1. Knurled Finger Diameter:12 mm

2. Knurled Finger Length:80 mm

3. Baffle Plate Diameter:50 mm

4. Baffle Plate Length:100 mm

5. Baffle thickness:20 mm


Application:

1. The joint part of The Standard Test Knurled Finger Probe can't touch the live parts or close to the dangerous parts, and50 mmto20 mmbaffle plate cannot enter.

2. In the prevent electric shock test, wirings , power devices, and lighting devices are needed.


Notes:

Both joints shall permit movement in the same plane and the same direction through an angle of 90o with a 0o to +10o tolerance.





Company introduction

HK LEE HING INDUSTRY CO., LTD are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.


Main Products: Go Not Go Gauges, IP Tester, Test Probe Kit, Impact Test Equipment, Test Probes, Spring Hammer, IEC 61032 Test Finger, AC Hipot Tester, IEC Test Probe, UL Test Probe, Material Flammability Tester, IP Code Tester, Impact Test Apparatus, Security Testing Machine, Plugs and Socket Outlet Gauge, Lamp Cap Gauge Tester, Lampholders Gauge Tester, Plug & Socket Tester, Electrical Safety Tester, LED Test Instruments, Environmental Test Equipment, Instrument Accessories, Weighing Sensor and More.


If you require equipment to test products such as home appliances, electrical accessories like switches, sockets, connectors, etc. industrial & road lighting luminaires, automobile lighting systems or related categories, we can provide the solutions you need.


We would appreciate your comments on the layout design, presentation or other aspects of our website.

Website: http://www.djscrm.com



Contact information

Contacts: Eason Wang

E-mail: info@iec-equipment.com

TEL: +86-755-33168386

FAX: +86-755-61605199

Phone: +86-15919975191

SKYPE: carlisle.wyk

Address: 1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China

ZIP: 518102

Website: http://www.china-gauges.com/


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