Home > Test Probe,Test Finger,Test Pins
Model | Describe | Reference standard | Specification |
LX-1201 | IEC 61032 Figure 1 - Test probe A |
IEC60529 IEC61032 |
Ball diameter: 50 mm Baffle plate diameter: 45 mm Baffle plate thickness: 4 mmHandle diameter: 10 mm Handle length: 100 mm Material: Nylon + stainless steel |
LX-1202 | IEC 61032 Figure 2 - Test probe B |
IEC60529 IEC61032 IEC60335 IEC60884 IEC60745 IEC60045 IEC60950 IEC60238 IEC60601 IEC60968 IEC61010 IEC60065 |
Knurled finger diameter: 12 mm Knurler finger length: 80 mm Baffle plate diameter: 50 mm Baffle plate length: 100 mm Baffle thickness: 20 mm |
LX-1203 | IEC 61032 Figure 3 - Test probe C |
IEC61032 IEC60529 |
Test probe length: 100 mm Test probe diameter: 2.5 mm Dam-sphere diameter: 35 mm Handle diameter: 10 mm Handle length: 100 mm Material: Nylon + hardened steel |
LX-1204 | IEC 61032 Figure 4 - Test probe D |
IEC61032 IEC60529 |
Test probe length: 100 mm Test probe diameter: 1 mm Dam-sphere diameter: 35 mm Handle diameter: 10 mm Handle length: 100 mm Material: Nylon + hardened steel |
LX-B500 | IEC 61032 Figure 5 – Test probe 1 | IEC61032 |
Diameter: 50 mm Weight: 500 g |
LX-B015 | IEC 61032 Figure 6 – Test probe 2 | IEC61032 |
Diameter: 12.5 mm Weight: 15 g |
LX-1211 | IEC 61032 Figure 7 – Test probe 11 |
IEC61032 IEC60065 IEC60335-1 IEC60884-1 IEC60238 IEC60950 IEC61010 |
Nodular Finger length: 80 mm Nodular Finger diameter: 12 mm Dam-board diameter: 50 mm Dam-board thickness: 5 mm Material: Nylon and stainless steel |
LX-1213 | IEC 61032 Figure 9 – Test probe 13 |
IEC60065 IEC60335-1 IEC60950 IEC61302 IEC60601 IEC60745 |
Test probe diameter: head 3 mm, tail 4 mm Test probe length: 15 mm Dam-board diameter: 25 mm Dam-board thickness: 5 mm Material: Handle is made of Nylon, tip is stainless steel |
LX-1212 | IEC 61032 Figure 8 – Test probe 12 |
IEC61032 |
Test probe diameter: 4 mm Test probe length: 50 mm Dam-board diameter: 25 mm Dam-board thickeness: 4 mm Material: Handle is made of Nylon, tip is stainless steel |
LX-1219 | IEC 61032 Figure 13 – Test probe 19 (small finger probe Φ 5.6) |
IEC61032 EN71 ASTM F963 |
Knurled finger diameter: φ5.6 mm Head radius: 2.8 mm Knurled finger length: 44 mm(Three knurls,16.7 mm knurl) Material: Nylon and stainless steel |
LX-1218 | IEC 61032 Figure 12 – Test probe 18 (small finger probe Φ 8.6) |
IEC61032 EN71 ASTM F963 |
Knurled finger diameter: φ8.6 mm Head radius: 4.3 mm Knurled finger length: 57.9 mm (Three knurls,19.3 mm knurl) Material: Nylon and stainless steel |
LX-1231 | IEC 61032 Figure 14 – Test probe 31 | IEC61032 |
Test Rod diameter: φ25 mm Rigid Finger length: 80 mm Dam-board diameter: 60-110 mm |
LX-1232 | IEC 61032 Figure 15 – Test probe 32 | IEC61032 |
Test Rod diameter: φ25 mm Dam-board diameter: 50 mm |
LX-1241 | IEC 61032 Figure 16 – Test probe 41 |
IEC61032 |
Test Rod diameter: 30 mm Rigid Finger length: 80 mm Handle diameter: 50 mm Handle length: 80 mm |
LX-1243 | IEC 61032 Figure 17 – Test probe 43 | IEC61032 |
Bar wide: 50 mm Thickness: 5 mm |
HK LEE HING INDUSTRY CO., LTD are specialized in manufacturing special, custom built, test and measuring equipment for products testing as per international norms and offering calibration services and related information. Our products and services are used by research & development establishments, test laboratories, defense establishments, government institutions & manufacturing industries to fulfill the clients' requirements.
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