Home > Test Probe,Test Finger,Test Pins

CEI 23-50 Fig. 3 Calibro di verifica della non accessibilità alle parti attive attraverso gli schermi dopo la prova di funzionamento normale

CEI 23-50 Fig. 3 Calibro d

According to standard CEI 23-50 Figure 3....

CEI 23-50 Fig. 2 Dito Di Prova Articolato

CEI 23-50 Fig. 2 Dito Di P

According to standard CEI 23-50 Figure 2....

IEC Steel Wire with Φ1 mm with Dynamometer 1N

IEC Steel Wire with Φ1 mm

IP4X Test Probe ( Test Probe D) is the necessary tool to pro...

IEC Articulating Finger Probe with Dynamometer 10N

IEC Articulating Finger Pr

IP2X Test Finger Probe is a precision test probe made accord...

IEC Steel Rod Φ2.5mm with Dynamometer 3N

IEC Steel Rod Φ2.5mm with

IP3X Test Probe Pin is the necessary tool to proceed protect...

IEC Test Sphere Φ12.5 mm with Dynamometer 50N

IEC Test Sphere Φ12.5 mm w

The rigid sphere (12.5 mm) is designed and manufactured to ...

IEC Test Sphere Φ50 mm with Dynamometer 50N

IEC Test Sphere Φ50 mm wit

IP1X Test Probe is necessary appliance for household and sim...

IP2XC Test Probe

IP2XC Test Probe

According to the DIN40050 IEC60529....

UL 499 Figure SB4.1 IEC Test Pin

UL 499 Figure SB4.1 IEC Te

UL 499 Figure SB4.1 IEC Test Pin. According to standard ...

Test Pin of BS 1363-2 Figure 1

Test Pin of BS 1363-2 Figu

Φ 1mm, 20mm long, according to BS1363-2 figure 1....

UL498 Figure 9.1 Articulate Probe with Web Stop

UL498 Figure 9.1 Articulat

Mainly used for the inspection to prevent the body touch dan...

DIN VDE 0620-1 Lehre 13 Lehre zur Prüfung der Nichtberührbarkeit von aktiven Teilen durch die Shutter hindurch und von aktiven Teilen von Steckdosen mit höherem Schutzgrad

DIN VDE 0620-1 Lehre 13 Le

DIN VDE 0620-1 Lehre 13 Lehre zur Prüfung der Nichtberührbar...

DIN VDE 0620-1 Lehre 15 Lehre zur Prüfung der Nichtberührbarkeit von aktiven Teilen durch die Shutter hindurch nach der Prüfung des bestimmungsgemäßen Betriebs

DIN VDE 0620-1 Lehre 15 Le

DIN VDE 0620-1 Lehre 15 Lehre zur Prüfung der Nichtberührbar...

IEC 60238 Figure 16 Standard Test Finger

IEC 60238 Figure 16 Standa

The Jointed Test Finger is a precision test probe made accor...

Test Hook of IEC 62368-1 Figure 20

Test Hook of IEC 62368-1 F

Used on enclosures prior to accessibility testing. The test ...

Test Pin of IEC 60601-1 Figure 8

Test Pin of IEC 60601-1 Fi

Test Pin of IEC 60601-1 Figure 8...

Blunt Probe of Figure V.3 of IEC 62368-1

Blunt Probe of Figure V.3

Blunt Probe of Figure V.3 of IEC 62368-1...

Jointed Test Probe and Unjointed Test Probe of IEC 62368 Figure V.1

Jointed Test Probe and Unj

Jointed Test Probe and Unjointed Test Probe of IEC 62368 Fig...

12.5mm Test Sphere Probe with 30N Force

12.5mm Test Sphere Probe w

12.5mm Test Sphere Probe with 30N Force...

Foot Probe of BS EN 60335-2-2 Figure Z101

Foot Probe of BS EN 60335-

Foot Probe of BS EN 60335-2-2 Figure Z101...

Accessibility Probe of UL 1017 Figure 25

Accessibility Probe of UL

Accessibility Probe of UL 1017 Figure 25...

Test Nails 1 mm x 50 mm of IEC/EN60335-2-11 Clause 19.102

Test Nails 1 mm x 50 mm of

Test Nails 1 mm x 50 mm of IEC/EN60335-2-11 Clause 19.102...

UL982 Figure 58.5 Probe PA190

UL982 Figure 58.5 Probe PA

UL982 Figure 58.5 Probe PA190...

UL 499 Figure 7.4 Probe for Hand-supported Enclosure PA180

UL 499 Figure 7.4 Probe fo

UL 499 Figure 7.4 Probe for Hand-supported Enclosure PA180 ...

« 12345 ... 7 »
close
Scan the qr codeClose
the qr code